IEC 61032 PDF

IEC the Standard Jointed Test Finger Probe B. IP2X Protection Probe. 1. Conforms to: Standard IEC , IEC , IRAM. IEC Test Probe 13 Meets IEC CSA & UL Requirements, Supplier Wholesale Precision Test Probes IEC Short Probe Find the most up-to-date version of IEC at Engineering

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IEC 61032 test probe

The rod is made of stainless steel. Our products enhance good selling at home and abroad, and have established supply relationships with a ifc of well-known companies. Product Details This probe is intended to verify the basic protection against access to hazardous parts. It is extremely durable and is provided with continuity provision to the tip.

Complies with UL Standards. Damaged probes should be discarded — only undamaged probes should be used to insure reliable test results. Product Details Several Different accessibility probe kits are available for specific standards.

It is also used to verify the protection against access with a finger. We provide you with industry leading test equipment, advanced online system and solutions—anywhere in the world. It features a palm simulator to prevent misuse, and restricted joint movement which simulates human finger movement.

Precision IEC Test Equipment , IEC 61032 Figure 2 Test Finger Probe B

This exclusive new design is high-precision machined of aluminum with a stainless steel tip. Uncertainty measurement data is available separately.


Standard test finger with force. Product Details For testing accessibility to hazardous moving parts 61302 as access to fan blades through a fan finger guard. Several different accessibility probe kits are available for specific standards.

It checks the security of parts that snap together. Product Details The rubber accessibility probe is intended for testing accessibility on modular jacks per Section 20 of the Standard for Communications-Circuit Accessories, UL Case is jec at a nominal charge.

The spring loading in the handle can be calibrated to the force necessary to use the instrument. IEC Clause Product Details This product is used for testing access to document shredders. True color liquid crystal display 7 Inch Touch screen Auxiliary mechanism: Probe Kits offer substantial cost savings, not to mention added convenience and portability! This product includes certificate of calibration. The unit comes with NIST traceable certificate and calibration.

It is used to check for limited access to telecommunications voltages TNVmainly telephone jacks and operator areas. 6032 accredited calibration is available, but additional charges apply. Model CP Coin Probe. The AWP is made of solid aluminum to conserve weight yet maintain rigidity.

If you have skype or whatsapp, pls tell me, we can chat more smoothly. Unit comes with NIST traceable certificate and cases are avaiable. Aluminum Box Delivery Time: Product Details IEC articulating finger probe having a circular stop face with a diameter of 50 mm, instead of the non-circular face.


Both the disk and the finger are certified to meet the GR requirements. Made entirely of stainless steel. The wire is made of stainless steel. There is an additional fee for the data, and it must be ordered in advance.

Product Details Used to verify protection against access to hazardous parts by use of a tool through holes which give access 6032 pre-set controls. Meets Requirements for Testing Standard s including but not limited to: Others maintain kec the tip needs to be more rigid, because of the cutting blades.

Large baffle test finger. The Test Finger must be purchased seperately! This unit is required in many standards.

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Satisfies basic standard for telecom product safety. This underscores their lack of knowledge of the requirements as you do not perform the test with the unit energized!


Palm simulator and restricted joint movement simulates human finger movement. Unit is NIST traceable, measurement data is available at a nominal charge and cases are available. No damage can occur to the probe unless the shredder is energized – – in which case there is extreme danger in performing the test!